This seminar will introduce techniques of surface analysis and interface analysis to the advanced student.  The class meets once per week for discussion and presentation.  Laboratory demonstrations and exercises are correlated with the topics covered.  Techniques presented will include:  Auger electron spectroscopy, Scanning Auger Microscopy, Depth profiling, X-ray photoelectron spectroscopy, electron energy loss spectroscopy, low energy electron diffraction, secondary ion mass spectroscopy. 

Course credit: 1.5 credit hours

Course prerequisites: quantum mechanics and electromagnetism.

Course structure:  Weekly reading assignments.  Four laboratory assignments with reports.

Grading: Grades are determined by the laboratory reports and attendance.

Textbook

The text is: “Surface Analysis” 2nd edition, by: Vickerman and Gilmore. (Wiley press)